ATOMIC FORCE MICROSCOPY AND ITS APPLICATION IN SCIENCE, ENGINEERUNG AND RESTORATION
The review of analytical technique for study of micro-structure and topography of surfaces of materials with extra-high resolution – atomic-force microscopy – is given in the paper. Brief description of physical principles of operation and main application of this technique, including physical and biological researches as well industry and artworks conservation, is presented.
Authors: V. A. Parfenov, I. A. Yudin
Direction: Instrument Engineering and Information-Measurement Technologies
Keywords: Scanning probe microscopy, atomic-force microscope, nanoidentity, thin films, biology and medicine, restoration, ablation
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