SPECIAL SITUATIONS WHEN YOU COMPACT A VLSI FRAGMENTS LAYOUT WITH CHANGING FORMS OF TRANSISTORS
The article describes the ways to deal with excessive change in electrical circuits’ characteristics, when you compact a VLSI fragments layout with changing forms of transistors, which ensures extremely dense packing of VLSI fragments layout.
Authors: S. E. Mironov, A. O. Mon’ko, N. M. Safiannikov
Direction: Informatics, management and Computer Technology
Keywords: Process tolerant design of layout, transistors form change, automation
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